Revolutionary True 3D In-line Dispensing Process Inspection (DPI) with a Thickness Measurement Solution based on Patented Technologies. Most optical systems use UV light to inspect the surface for presence and gauges to measure material thickness in a particular spot, which does not provide the accuracy and repeatability needed. Inspecting transparent materials proved to be a challenge due to the laser’s shallow penetration depth and elapsed time. Traditional laser-confocal or electron microscope systems measure three-dimensional shapes. Koh Young’s revolutionary Neptune C+ provides the ultimate solution to these challenges.

  • True 3D Profiling
  • Superior Performance
  • AI-powered capabilites

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